Abstract
Electrostatic discharge (ESD) is a critical concern in semiconductor device manufacturing and testing, as it can cause significant damage to integrated circuits (ICs). Among the various ESD models used for testing, the Human Body Model (HBM) is the most prevalent for simulating electrostatic discharges that mimic human contact with sensitive devices. This paper explores the ESD HBM model and its relevance in the semiconductor industry, focusing on the LISUN ESD-883D HBM/MM ESD Simulators for IC Testing. We delve into the principles behind the ESD HBM model, its testing standards, and how the LISUN ESD-883D system addresses the needs of IC testing, ensuring device safety and compliance.
1. Introduction
Electrostatic discharge (ESD) is a transient flow of electrical current that occurs when two electrically charged objects come into contact or close proximity. ESD can result in permanent damage to semiconductor components, affecting their reliability and functionality. In semiconductor testing, the Human Body Model (HBM) is one of the most widely accepted methods for evaluating the robustness of devices against ESD.
This paper discusses the ESD HBM model in detail, highlighting its testing methodologies and standards, and reviews how the LISUN ESD-883D HBM/MM ESD Simulator contributes to precise and efficient IC testing.
2. Overview of ESD Models
In semiconductor testing, several ESD models are commonly used:
• Human Body Model (HBM): Simulates ESD from human contact with ICs.
• Machine Model (MM): Simulates discharge from machines handling ICs.
• Charged Device Model (CDM): Simulates ESD from a charged device discharging to a grounded object.
The ESD HBM model is particularly important because it simulates the real-world scenario where a human body, carrying electrostatic charge, touches an electronic device.
3. The ESD HBM Model Explained
The ESD HBM model is standardized in several documents, including ANSI/ESDA/JEDEC JS-001 and MIL-STD-883. The model simulates a discharge from a human body, which is modeled as a 100 pF capacitor discharged through a 1.5 kΩ resistor. The discharge event usually happens in less than 150 nanoseconds, and the amount of energy released can cause damage to sensitive semiconductor devices.
HBM discharges are characterized by their peak current, rise time, and waveform shape. The severity of the discharge is typically quantified in volts (V), with testing done at levels ranging from 500 V to several thousand volts.
Table 1: Characteristics of ESD HBM Waveform
Voltage (V)
Peak Current (A)
Rise Time (ns)
Duration (ns)
500
0.33
2
150
1000
0.67
2
150
2000
1.33
2
150
4000
2.67
2
150
ESD-883D
Electrostatic Discharge (ESD) IC Tester
4. ESD Testing Standards
There are several industry standards used to define the parameters and testing procedures for ESD testing, particularly for HBM. These standards help ensure that semiconductor devices are sufficiently robust to withstand potential ESD events during normal operation.
• ANSI/ESDA/JEDEC JS-001: Defines HBM testing for ICs, specifying the waveform and testing conditions.
• MIL-STD-883: Covers ESD testing for military devices, including HBM standards.
• JEDEC JESD22-A114: Also used for HBM testing, particularly in commercial applications.
All these standards ensure that ESD testing mimics real-world conditions, enabling manufacturers to better protect ICs from electrostatic damage.
5. The LISUN ESD-883D HBM/MM ESD Simulator
The LISUN ESD-883D HBM/MM ESD Simulator is an advanced testing system designed to simulate both Human Body Model (HBM) and Machine Model (MM) discharges. This versatile system enables precise control over the testing environment and ensures compliance with global testing standards, including ANSI/ESDA/JEDEC JS-001, IEC 61000-4-2, and MIL-STD-883.
Key features of the LISUN ESD-883D include:
• HBM and MM testing capabilities: The system can simulate ESD discharges according to both the HBM and MM models, making it suitable for a wide range of testing applications.
• Programmable voltage levels: The simulator offers a wide range of voltage settings, from 50V to 8000V, allowing users to test ICs at various stress levels.
• Accurate discharge waveforms: The system ensures that the generated waveforms meet the stringent requirements of global ESD standards.
• User-friendly interface: The LISUN ESD-883D features an intuitive interface, making it easy to set up tests and analyze results.
6. Testing ICs with LISUN ESD-883D
When testing ICs using the LISUN ESD-883D, several critical parameters must be considered. The voltage level and number of discharge events are adjusted according to the IC’s expected exposure to ESD in its operational environment. Below is an example of a typical testing procedure using the LISUN ESD-883D:
• Step 1: Test Setup: The IC under test is placed on a grounded test platform. The LISUN ESD-883D is configured with the desired test parameters, including voltage level and discharge count.
• Step 2: Discharge: The system discharges at the specified voltage level, with the waveform shape and peak current carefully monitored.
• Step 3: Evaluation: After the test, the IC is evaluated for functional damage or degradation in performance.
Table 2: Sample Test Results Using LISUN ESD-883D
IC Model
Test Voltage (V)
Discharge Count
Pass/Fail
Post-Test Functionality
IC-A
1000
5
Pass
Fully Functional
IC-B
2000
10
Pass
Degraded Performance
IC-C
4000
3
Fail
Non-Functional
7. ESD Protection Strategies in Semiconductor Design
Incorporating ESD protection into semiconductor devices is crucial to ensuring long-term reliability. Designers employ various strategies to protect ICs from ESD damage, including:
• On-chip protection diodes: These are placed at the inputs and outputs of ICs to divert ESD current away from sensitive internal circuitry.
• Grounding and shielding: Proper grounding and the use of shielded enclosures can reduce the risk of ESD exposure.
• Use of protective packaging: During transport and handling, ICs are stored in ESD-safe packaging materials to minimize the chance of discharge.
8. Advantages of LISUN ESD-883D in IC Testing
The LISUN ESD-883D HBM/MM ESD Simulator offers several advantages for IC testing:
• Precision and reliability: The system ensures accurate testing conditions, making it easier to identify potential ESD vulnerabilities in ICs.
• Compliance with international standards: By adhering to global standards, the LISUN ESD-883D helps manufacturers meet industry requirements.
• Flexibility: With programmable voltage levels and discharge counts, the system can be customized for various testing scenarios.
9. Conclusion
The ESD HBM model plays a vital role in the semiconductor industry by simulating electrostatic discharges that mimic human contact. Devices like the LISUN ESD-883D HBM/MM ESD Simulator enable precise testing according to global standards, helping manufacturers ensure that their ICs are robust enough to withstand ESD events. As ESD remains a significant threat to semiconductor reliability, systems like the LISUN ESD-883D are crucial in safeguarding the performance and longevity of ICs in today’s technology-driven world.
References
ANSI/ESDA/JEDEC JS-001. “Human Body Model (HBM) – Component Level.”
MIL-STD-883. “Test Method Standard for Microcircuits.”
LISUN Group. “LISUN ESD-883D HBM/MM ESD Simulators for IC Testing.” Available at: https://www.lisungroup.com/products/emi-and-emc-test-system/electrostatic-discharge-esd-ic-tester.html https://www.lisungroup.com/news/technology-news/understanding-the-esd-hbm-model-and-its-application-in-semiconductor-testing-using-lisun-esd-883d-hbm-mm-esd-simulators-for-ic-testing.html
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